• DocumentCode
    1028969
  • Title

    Study of whispering gallery modes in anisotropic single-crystal dielectric resonators

  • Author

    Krupka, Jerzy ; Cros, Dominique ; Aubourg, Michel ; Guillon, Pierre

  • Author_Institution
    Istytut Mikroelektron. i Optoelektron. Politechniki, Warszawa, Poland
  • Volume
    42
  • Issue
    1
  • fYear
    1994
  • fDate
    1/1/1994 12:00:00 AM
  • Firstpage
    56
  • Lastpage
    61
  • Abstract
    The Rayleigh-Ritz method and the finite element method nongenerating spurious solutions are employed for analysis of whispering gallery modes (WGMs) in cylindrical single-crystal anisotropic dielectric resonators. These methods allow accurate computation of the resonant frequencies, the Q-factors (depending on the dielectric and on the conductor losses), and the electromagnetic field distributions for all WGMs in the presence of additional elements like metal shields, MIC substrate, or supports. Different families of modes are studied both theoretically and experimentally. The mode coupling phenomenon is investigated. A WGM single-crystal quartz resonator is presented having an unloaded Q-factor greater than 30000 at about 100 GHz, including radiation and dielectric losses
  • Keywords
    Q-factor; dielectric losses; dielectric resonators; finite element analysis; microwave devices; quartz; 100 GHz; EHF; FEM; MIC substrate; MM-wave type; Q-factors; Rayleigh-Ritz method; SiO2; WGM; anisotropic single-crystal; conductor losses; cylindrical single-crystal anisotropic dielectric resonators; dielectric; dielectric resonators; electromagnetic field distributions; finite element method; metal shields; mode coupling phenomenon; resonant frequencies; single-crystal quartz resonator; supports; whispering gallery modes; Anisotropic magnetoresistance; Conductors; Dielectric losses; Dielectric substrates; Distributed computing; Finite element methods; Magnetic losses; Q factor; Resonant frequency; Whispering gallery modes;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.265528
  • Filename
    265528