Title :
Analysis of an all evaporated InAs TFT capable of working at frequencies in the GHz region
fDate :
9/1/1967 12:00:00 AM
Keywords :
Diodes; Frequency; Laboratories; Pulse measurements; Rough surfaces; Silicon; Substrates; Surface roughness; Thin film transistors; Transconductance;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1967.16023
