Title :
Orientational and azimuthal dependence of piezoresistivity and mobility in silicon inversion layers
Author :
Colman, D. ; Mize, J.P. ; Bate, R.T.
fDate :
9/1/1967 12:00:00 AM
Keywords :
Crystallization; Cyclotrons; Effective mass; Instruments; Piezoresistance; Silicon; Solid state circuits; Surface waves; Temperature; Transducers;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1967.16048
