DocumentCode :
1029938
Title :
Noise figure of UHF transistors as a function of frequency and bias conditions
Author :
Agouridis, Dimitrios C. ; Van Der Ziel, Aldert
Author_Institution :
Memphis State University, Memphis, Tenn.
Volume :
14
Issue :
12
fYear :
1967
fDate :
12/1/1967 12:00:00 AM
Firstpage :
808
Lastpage :
816
Abstract :
It is shown that the observed values of the minimum noise figure F_{\\min} of UHF transistors in common base connection can be explained in terms of the device parameter (1-\\alpha _{dc}) r_{b\´b}/R_{e0} and fαfor frequencies up to 1000 MHz. An interesting collector saturation effect is observed that gives a strong increase in UHF noise figure at high currents. Many features of the dependance of F_{\\min} on operating conditions can be explained by this effect. The current dependence of F_{\\min} for large values of |VCB| and high currents suggests a distribution in diffusion times through the base region. At intermediate frequencies, the noise figure increases with increasing collector bias |VCB| due to an increase in r_{b\´b} , which in turn is caused by the dependence of the base width on |VCB|.
Keywords :
Circuits; Density estimation robust algorithm; Diodes; Electric breakdown; Electric variables measurement; Electron devices; Frequency measurement; Microwave transistors; Noise figure; P-n junctions;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1967.16114
Filename :
1474837
Link To Document :
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