• DocumentCode
    1030068
  • Title

    An advanced field prediction model including diffuse scattering

  • Author

    Degli-Esposti, Vittorio ; Guiducci, Doriana ; de´Marsi, A. ; Azzi, Pierfrancesco ; Fuschini, Franco

  • Author_Institution
    Dept. of Electron. Eng. & Inf. Syst., Univ. of Bologna, Italy
  • Volume
    52
  • Issue
    7
  • fYear
    2004
  • fDate
    7/1/2004 12:00:00 AM
  • Firstpage
    1717
  • Lastpage
    1728
  • Abstract
    Ray tracing (RT) models are now widely adopted for field prediction in urban environment. Nevertheless, conventional RT tools still suffer for excessive central processing unit (CPU) time and inaccuracy in wide-band prediction. By increasing the maximum number of successive interactions (reflections, diffractions) little improvement in wide-band results can be usually achieved while CPU time increases exponentially. In the present paper, it is shown that by integrating reflection/diffraction with diffuse scattering, good narrow-band and wide-band results can be obtained with a low number of interactions. The adopted scattering model is a simple ray-based model, which has been embedded in a three-dimensional (3-D) RT program. The impact of diffuse scattering on narrowband and wide-band parameters is analyzed in the paper and the complete model is compared with measurements in a variety of cases, showing the validity of the approach.
  • Keywords
    electromagnetic wave scattering; land mobile radio; prediction theory; radiowave propagation; ray tracing; CPU time; advanced field prediction model; diffuse scattering; land mobile radio; narrow-wide-band results; radio propagation; ray tracing models; urban areas; Central Processing Unit; Narrowband; Optical diffraction; Optical propagation; Optical reflection; Optical scattering; Predictive models; Radio propagation; Ray tracing; Wideband; Land mobile radio; radio propagation; ray tracing; scattering; urban areas;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.2004.831299
  • Filename
    1310631