• DocumentCode
    1030430
  • Title

    Generalized Kirchoff´s current and Voltage law formulation for coupled circuit-electromagnetic Simulation with surface Integral equations

  • Author

    Wang, Yong ; Gope, Dipanjan ; Jandhyala, Vikram ; Shi, C. J Richard

  • Author_Institution
    Electr. Eng. Dept., Univ. of Washington, Seattle, WA, USA
  • Volume
    52
  • Issue
    7
  • fYear
    2004
  • fDate
    7/1/2004 12:00:00 AM
  • Firstpage
    1673
  • Lastpage
    1682
  • Abstract
    In this paper, a new formulation for coupled circuit-electromagnetic (EM) simulation is presented. The formulation employs full-wave integral equations to model the EM behavior of two- or three-dimensional structures while using modified nodal analysis to model circuit interactions. A coupling scheme based on charge and current continuity and potential matching, realized as a generalization of Kirchoff´s voltage and current laws, ensures that the EM and circuit interactions can be formulated as a seamless system. While rigorous port models for EM structures can be obtained using the approach discussed herein, it is shown that the coupling paradigm can reveal additional details of the EM-circuit interactions and can provide a path to analysis-based design iteration.
  • Keywords
    coupled circuits; electromagnetic coupling; integral equations; lumped parameter networks; printed circuits; radiofrequency amplifiers; radiofrequency integrated circuits; system-on-chip; Kirchoff current formulation; Kirchoff voltage law formulation; coupled circuit electromagnetic simulation; electromagnetic circuit interactions; full wave integral equations; model circuit interactions; nodal analysis; potential matching; surface integral equations; three-dimensional structures; two dimensional structures; Circuit simulation; Coupling circuits; Electromagnetic analysis; Finite difference methods; Frequency; Integral equations; Moment methods; RLC circuits; Time domain analysis; Voltage; Coupled circuit–electromagnetic; EM; MoM; method of moments; signal integrity; simulation; surface integral equation;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2004.830482
  • Filename
    1310664