Title :
Solid-state imaging—Methods of approach
Author :
List, William F.
Author_Institution :
Westinghouse Electric Corporation, Baltimore, Md.
fDate :
4/1/1968 12:00:00 AM
Abstract :
Various approaches to solid-state imaging systems are summarized, and characteristic features reviewed. The paper assumes some familiarity with the work reported in preceding papers and attempts to relate the generalized tradeoffs between the various approaches. It is concluded that the capability has been developed to realize limited performance solid-state imaging systems, but that considerable additional development work is needed to realize high quality, high performance solid-state imaging.
Keywords :
Diodes; High-resolution imaging; Image resolution; Paper technology; Semiconductor thin films; Sensor arrays; Silicon; Solid state circuits; Thin film devices; Thin film transistors;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16174