DocumentCode :
1030510
Title :
Solid-state imaging—Methods of approach
Author :
List, William F.
Author_Institution :
Westinghouse Electric Corporation, Baltimore, Md.
Volume :
15
Issue :
4
fYear :
1968
fDate :
4/1/1968 12:00:00 AM
Firstpage :
256
Lastpage :
261
Abstract :
Various approaches to solid-state imaging systems are summarized, and characteristic features reviewed. The paper assumes some familiarity with the work reported in preceding papers and attempts to relate the generalized tradeoffs between the various approaches. It is concluded that the capability has been developed to realize limited performance solid-state imaging systems, but that considerable additional development work is needed to realize high quality, high performance solid-state imaging.
Keywords :
Diodes; High-resolution imaging; Image resolution; Paper technology; Semiconductor thin films; Sensor arrays; Silicon; Solid state circuits; Thin film devices; Thin film transistors;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1968.16174
Filename :
1475076
Link To Document :
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