DocumentCode
1030510
Title
Solid-state imaging—Methods of approach
Author
List, William F.
Author_Institution
Westinghouse Electric Corporation, Baltimore, Md.
Volume
15
Issue
4
fYear
1968
fDate
4/1/1968 12:00:00 AM
Firstpage
256
Lastpage
261
Abstract
Various approaches to solid-state imaging systems are summarized, and characteristic features reviewed. The paper assumes some familiarity with the work reported in preceding papers and attempts to relate the generalized tradeoffs between the various approaches. It is concluded that the capability has been developed to realize limited performance solid-state imaging systems, but that considerable additional development work is needed to realize high quality, high performance solid-state imaging.
Keywords
Diodes; High-resolution imaging; Image resolution; Paper technology; Semiconductor thin films; Sensor arrays; Silicon; Solid state circuits; Thin film devices; Thin film transistors;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1968.16174
Filename
1475076
Link To Document