• DocumentCode
    1030510
  • Title

    Solid-state imaging—Methods of approach

  • Author

    List, William F.

  • Author_Institution
    Westinghouse Electric Corporation, Baltimore, Md.
  • Volume
    15
  • Issue
    4
  • fYear
    1968
  • fDate
    4/1/1968 12:00:00 AM
  • Firstpage
    256
  • Lastpage
    261
  • Abstract
    Various approaches to solid-state imaging systems are summarized, and characteristic features reviewed. The paper assumes some familiarity with the work reported in preceding papers and attempts to relate the generalized tradeoffs between the various approaches. It is concluded that the capability has been developed to realize limited performance solid-state imaging systems, but that considerable additional development work is needed to realize high quality, high performance solid-state imaging.
  • Keywords
    Diodes; High-resolution imaging; Image resolution; Paper technology; Semiconductor thin films; Sensor arrays; Silicon; Solid state circuits; Thin film devices; Thin film transistors;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1968.16174
  • Filename
    1475076