Title :
17 ps rise-time measurement by photoemission sampling
Author :
Blacha, A. ; Clauberg, R. ; Seitz, H.K. ; Beha, H.
Author_Institution :
IBM Research Division, Zurich Research Laboratory, Rÿschlikon, Switzerland
Abstract :
We report on the first voltage measurements of signals with rise times below 20 ps by photoemission stampling based on the single-photon process. The high time and voltage resolution together with the potential of a submicrometre spatial resolution enables tesing of very high-speed VLSI circuits by this newly developed method.
Keywords :
VLSI; integrated circuit testing; measurement by laser beam; photoelectron spectra; voltage measurement; 17 ps; IC testing; VHSIC; VLSI; photoemission sampling; rise-time measurement; signals with rise times below 20 ps; single-photon process; submicrometre spatial resolution; submicron resolution; time resolution; voltage measurements; voltage resolution;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19870176
