• DocumentCode
    1030610
  • Title

    17 ps rise-time measurement by photoemission sampling

  • Author

    Blacha, A. ; Clauberg, R. ; Seitz, H.K. ; Beha, H.

  • Author_Institution
    IBM Research Division, Zurich Research Laboratory, Rÿschlikon, Switzerland
  • Volume
    23
  • Issue
    5
  • fYear
    1987
  • Firstpage
    249
  • Lastpage
    250
  • Abstract
    We report on the first voltage measurements of signals with rise times below 20 ps by photoemission stampling based on the single-photon process. The high time and voltage resolution together with the potential of a submicrometre spatial resolution enables tesing of very high-speed VLSI circuits by this newly developed method.
  • Keywords
    VLSI; integrated circuit testing; measurement by laser beam; photoelectron spectra; voltage measurement; 17 ps; IC testing; VHSIC; VLSI; photoemission sampling; rise-time measurement; signals with rise times below 20 ps; single-photon process; submicrometre spatial resolution; submicron resolution; time resolution; voltage measurements; voltage resolution;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19870176
  • Filename
    4257502
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1030610