Title :
Novel microwave projection imaging for determination of internal structure
Author :
Schultz, K.I. ; Jaggard, D.L.
Author_Institution :
University of Pennsylvania, Moore School of Electrical Engineering, Philadelphia, USA
Abstract :
A novel microwave imaging technique based on the generalised weighted backprojection operator is introduced and tested using experimental data. Images of the internal structure of penetrable objects using this technique are compared and contrasted with images found from the classical back-projection method. It is demonstrated that the new method provides high-quality images of both discrete and continuous internal structure without the distortions characteristic of traditional methods.
Keywords :
microwave imaging; nondestructive testing; generalised weighted backprojection operator; high-quality images; internal structure; microwave projection imaging; penetrable objects;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19870195