• DocumentCode
    1030886
  • Title

    In this issue - Technically

  • Author

    Takeshita, Takaharu ; Sato, Takao ; Mitsuhara, Manabu ; Kondo, Yuta ; Sugo, M. ; Kato, Kazuhiko

  • Volume
    55
  • Issue
    2
  • fYear
    2008
  • Firstpage
    701
  • Lastpage
    701
  • Abstract
    In the above titled paper (ibid., vol. 54, no. 20, pp. 2644-2649, Oct. 07), there were errors for which corrections are presented here.
  • Keywords
    Distributed feedback devices; Failure analysis; Quantum well lasers; Semiconductor device reliability;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.912944
  • Filename
    4428284
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1030886