Title :
High-power impatt diodes utilizing ion implantation
Author :
Ying, R.S. ; Bower, R.W. ; English, D.L.
fDate :
6/1/1968 12:00:00 AM
Keywords :
Circuit noise; Diodes; Frequency; Germanium; Impedance; Ion implantation; Laboratories; Temperature; Testing; Thermal conductivity;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16238
