Title :
Computer calculations of avalanche-induced relaxation oscillations in silicon diodes
Author :
Ward, A.L. ; Udelson, B.J.
fDate :
6/1/1968 12:00:00 AM
Keywords :
Computer errors; Diodes; Electric breakdown; Frequency; Ionization; Laboratories; Resistors; Silicon; Space charge; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16243
