Title :
Time domain noise-induced jitter: Theory and precise measurement
Author :
Nunnelley, L. ; Harper, R.D. ; Burleson, M.
Author_Institution :
IBM Corporation, San Jose, CA, USA
fDate :
9/1/1987 12:00:00 AM
Abstract :
A theoretical relationship between recording channel signal-to-noise ratio and the time distribution of signal crossover (bitshift distribution) is derived. A technique for measuring crossover distributions with 5 picosecond resolution is described.
Keywords :
Magnetic measurements; Magnetic recording noise; Measurement noise; Noise measurement; Time domain measurements; Density measurement; Gaussian noise; Instruments; Jitter; Noise level; Noise measurement; Pulse amplifiers; Signal resolution; Time measurement; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1987.1065665
