Title :
Electron-beam-accessed silicon diode arrays for image-sensing applications
Author :
Labuda, E.F. ; Crowell, M.H.
fDate :
6/1/1968 12:00:00 AM
Keywords :
Cameras; Charge carrier processes; Diodes; Electron beams; Electron optics; Laboratories; Optical sensors; Silicon; Substrates; Telephony;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16257
