DocumentCode

1031424

Title

Bonding of beam-lead integrated circuits

Author

Howland, F.L. ; Clark, J.E. ; Eleftherion, M.P.

Volume

15

Issue

6

fYear

1968

fDate

6/1/1968 12:00:00 AM

Firstpage

421

Lastpage

421

Keywords

Assembly; Bonding forces; Copper; Gold; Integrated circuit packaging; Integrated circuit yield; Joining processes; Metallization; Silicon devices; Testing;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1968.16268

Filename

1475170