DocumentCode
1031538
Title
The results of precision microwave measurement of the internal parasitics of tunnel diodes
Author
Bandler, John W.
Volume
15
Issue
6
fYear
1968
fDate
6/1/1968 12:00:00 AM
Firstpage
423
Lastpage
423
Keywords
Cutoff frequency; Doping; Electrical resistance measurement; Gallium arsenide; Laboratories; Laser noise; Light emitting diodes; Microwave devices; Microwave measurements; Silicon;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1968.16278
Filename
1475180
Link To Document