DocumentCode
1031541
Title
Evaluation of effective throughput rate for certain ATE architectures with data compaction/decompaction
Author
Campbell, Steven R. ; Wagdy, Mahmoud Fawzy
Author_Institution
RCA, Burlington, MA, USA
Volume
37
Issue
1
fYear
1988
fDate
3/1/1988 12:00:00 AM
Firstpage
70
Lastpage
75
Abstract
Automatic test equipment (ATE) architectures for functional digital testing are presented. Formulas for effective throughput rate, refresh rate, burst rate, and compaction ratio are introduced to compare architectures. Methods and horizontal and vertical data compaction ratio are examined to determine the effect of compaction ratio on effective throughput rate
Keywords
automatic test equipment; computer architecture; data compression; digital instrumentation; electronic equipment testing; ATE architectures; burst rate; compaction ratio; data compaction/decompaction; effective throughput rate; functional digital testing; horizontal data compaction ratio; refresh rate; vertical data compaction ratio; Automatic testing; Circuit testing; Clocks; Compaction; Electronic equipment testing; Logic testing; Pins; Sequential analysis; Test pattern generators; Throughput;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.2667
Filename
2667
Link To Document