Title :
Hystero-Viscosity in Silicone
Author :
Malti, Michel G. ; Chatt, A.K.
Author_Institution :
Professor of electrical engineering, Cornell University, Ithaca, N. Y.
Keywords :
Aluminum; Capacitors; Circuit testing; Electronic ballasts; Fault location; Filters; Rectifiers; Resins; Switches; Voltage;
Journal_Title :
American Institute of Electrical Engineers, Transactions of the
DOI :
10.1109/T-AIEE.1948.5059685
