Title :
Interface trapping in unipolar space-charge-limited current
fDate :
6/1/1968 12:00:00 AM
Keywords :
Bandwidth; Circuit testing; Continuous wavelet transforms; Copper; Equations; Heat sinks; Laboratories; Structural beams; Time sharing computer systems; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16303
