DocumentCode
1032125
Title
Testing analogue circuits by power supply voltage control
Author
A´Ain, A.K.B. ; Dorey, A.P.
Author_Institution
Dept. of Eng., Lancaster Univ.
Volume
30
Issue
3
fYear
1994
fDate
2/3/1994 12:00:00 AM
Firstpage
214
Lastpage
215
Abstract
By varying the power supply voltages of an analogue integrated circuit as a testing technique it is possible to expose faults within the circuits which are difficult to detect by conventional input voltage stimulation. This technique is simple to implement and does not incur any area overhead penalty
Keywords
fault location; integrated circuit testing; linear integrated circuits; analogue integrated circuit; fault detection; input voltage; power supply voltage control; testing technique;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19940123
Filename
267235
Link To Document