Title :
New observation of charge injection in MOS analogue switches
Author :
Chen, Ming-Jer ; Gu, Y.-B. ; Wu, Tsai-Fu ; Hsu, Po-Chi ; Liu, Tin-Hao
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu
fDate :
2/3/1994 12:00:00 AM
Abstract :
Based on experimental analogue MOS switches, the authors report a new observation of the charge injection component due to channel charges in weak inversion. As identified by the mixed-mode circuit and device simulations, this new component can contribute comparably to the switch-induced error voltage on a switched capacitor
Keywords :
MOS integrated circuits; errors; linear integrated circuits; switched capacitor networks; MOS analogue switches; SC type; channel charges; charge injection; mixed-mode circuit/simulations; switch-induced error voltage; switched capacitor; weak inversion;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19940177
