• DocumentCode
    1032332
  • Title

    Bist structure using multi-input shift register with initial value

  • Author

    Hlawiczka, A.

  • Author_Institution
    Technical University of Gliwice, Instytut Elektroniki, Gliwice, Poland
  • Volume
    23
  • Issue
    9
  • fYear
    1987
  • Firstpage
    476
  • Lastpage
    478
  • Abstract
    Parallel signature analysers are very useful for compression of test response data for VLSI. In the letter the compression result is obtained from a signature of zeros alone or ones alone from a nonzero initial state, rather than from the traditional method of obtaining a nonzero signature from a zeroed MISR register. An algebraic description of such a signature analysis is given, realised by means of the external exclusive-OR-type MISR.
  • Keywords
    VLSI; digital integrated circuits; integrated circuit technology; integrated circuit testing; BIST structure; VLSI; built-in self-test; compression of test response data; external exclusive-OR-type MISR; multi-input shift register with initial value; nonzero initial state; parallel signature analysers; signature analysis; signature of all ones; signature of all zeros; signature of zeros alone;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19870343
  • Filename
    4257673