Title :
The charge distribution in high-speed transistors
Author :
Hachtel, G.D. ; Ruehli, Albert E.
fDate :
6/1/1968 12:00:00 AM
Keywords :
Charge measurement; Current measurement; Cutoff frequency; Geometry; Germanium; Integrated circuit technology; Silicon devices; Silicon on insulator technology; Space charge; Statistics;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16356
