• DocumentCode
    1032362
  • Title

    The charge distribution in high-speed transistors

  • Author

    Hachtel, G.D. ; Ruehli, Albert E.

  • Volume
    15
  • Issue
    6
  • fYear
    1968
  • fDate
    6/1/1968 12:00:00 AM
  • Firstpage
    437
  • Lastpage
    437
  • Keywords
    Charge measurement; Current measurement; Cutoff frequency; Geometry; Germanium; Integrated circuit technology; Silicon devices; Silicon on insulator technology; Space charge; Statistics;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1968.16356
  • Filename
    1475258