DocumentCode :
1032509
Title :
Effect of conducted EMI on the DC performance of operational amplifiers
Author :
Poulton, Adrian S.
Volume :
30
Issue :
4
fYear :
1994
fDate :
2/17/1994 12:00:00 AM
Firstpage :
282
Lastpage :
284
Abstract :
Electromagnetic interference can affect the performance of operational amplifiers even when the frequency is well above the usable frequency range of the amplifier. This can result in an apparent change in offset voltage. This effect is investigated experimentally with a number of device types. An attempt was made to compare the DC performance of various operational amplifiers in the presence of conducted impulsive EMI, as might be experienced in mixed analogue and digital circuitry. This Letter describes the test procedure and notes the results obtained
Keywords :
electromagnetic interference; integrated circuit testing; mixed analogue-digital integrated circuits; operational amplifiers; DC performance; conducted EMI; impulsive EMI; mixed analogue/digital circuitry; offset voltage; operational amplifiers; test procedure;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19940195
Filename :
267280
Link To Document :
بازگشت