Title :
Validity of kL evaluation by stopband method for ¿/4 DFB lasers with low reflecting facets
Author_Institution :
Toshiba Corporation, Electron Device Engineering Laboratory, Yokohama, Japan
Abstract :
The validity of the kL values estimated from the subthreshold stopband width of ¿/4-shifted DFB lasers with low reflecting facets is discussed quantitatively. The misestimation probability is calculated by varying the phase of the residual field reflectances at both facets. The results show that the residual reflectivity should be less than 0.05% to estimate the kL value validly when the true value of kL is less than 2.0.
Keywords :
distributed feedback lasers; reflectivity; semiconductor junction lasers; DFB lasers; coupling coefficient; low reflecting facets; misestimation probability; residual field reflectances; residual reflectivity; semiconductor laser; subthreshold stopband width; ¿ L values;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19870362
