Title :
A "Fail-safe" circuit principle in semiconductor and solid-state systems
Author :
Fitzgerald, Alan S.
Author_Institution :
333 Corte Madera Avenue, Mill Valley, CA, USA
fDate :
3/1/1966 12:00:00 AM
Abstract :
This paper deals with the problem of securing greater safety from shock hazard due to leakage to ground in installations involving portable tools, swimming-pool wiring, and hydrotherapy equipment, and proposals for "built-in" protective systems. Criticism has been directed at the use of transistors on grounds of reliability, and it has been required that such a system must "fail safe." The construction and performance of a compact test model, a protective element embodying magnetic amplifiers and a single diode, which fails safe if the diode fails either as open circuit or as short circuit, is described. This device will handle the starting current of a half-horsepower motor and will disconnect a load with leakage current to ground of less than two milliamperes.
Keywords :
Ground-fault-interrupting circuit breakers; Magnetic amplifiers; Circuit testing; Electric shock; Hazards; Magnetic circuits; Proposals; Protection; Safety devices; Semiconductor diodes; Solid state circuits; Wiring;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1966.1065794