DocumentCode
1032701
Title
A dynamic determination of the anisotropy field and the damping constant of thick magnetic films
Author
Zappe, H.H.
Author_Institution
IBM Corporation, Poughkeepsie, NY, USA
Volume
2
Issue
2
fYear
1966
fDate
6/1/1966 12:00:00 AM
Firstpage
73
Lastpage
76
Abstract
A new dynamic method for the measurement of Hk and the damping constant
of thick magnetic films is presented from both the theoretical and practical standpoint. The method is based on a property of the differential equation (1), which has been found to be adequate if applied to the read cycle. It is found that, if the easy-axis sense signals obtained with linearly rising hard-axis fields of different rise times are plotted vs. the respective hard-axis fields, the maxima of the sense signals lie almost precisely on a straight line. This straight line cuts the field axis at Hk . From the slope of this line it is possible to deduce
, which is primarily the eddy-current time constant for thick films. The resistivity of the magnetic material can, in this case, be evaluated directly if the physical dimensions of the film are known. The influence of dispersion and skew is discussed and found to be reasonably small. The further advantages are that no instrumental integration is needed and that the reading is quite precise. Small variations of Hk can, therefore, be easily recorded. Practical results obtained with thick magnetic films illustrate this method.
of thick magnetic films is presented from both the theoretical and practical standpoint. The method is based on a property of the differential equation (1), which has been found to be adequate if applied to the read cycle. It is found that, if the easy-axis sense signals obtained with linearly rising hard-axis fields of different rise times are plotted vs. the respective hard-axis fields, the maxima of the sense signals lie almost precisely on a straight line. This straight line cuts the field axis at H
, which is primarily the eddy-current time constant for thick films. The resistivity of the magnetic material can, in this case, be evaluated directly if the physical dimensions of the film are known. The influence of dispersion and skew is discussed and found to be reasonably small. The further advantages are that no instrumental integration is needed and that the reading is quite precise. Small variations of HKeywords
Magnetic anisotropy; Magnetic films; Magnetic measurements; Anisotropic magnetoresistance; Conductivity; Damping; Differential equations; Instruments; Magnetic field measurement; Magnetic films; Magnetic materials; Thick films; Thickness measurement;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1966.1065803
Filename
1065803
Link To Document