DocumentCode :
1032786
Title :
Three-wire cryoelectric memory systems
Author :
Sass, A.R. ; Nagle, E.M. ; Burns, L.L.
Author_Institution :
RCA Laboratories, Princeton, N.J.
Volume :
2
Issue :
3
fYear :
1966
fDate :
9/1/1966 12:00:00 AM
Firstpage :
398
Lastpage :
402
Abstract :
Systems requirements dictate that a memory, capable of storing 108- 109bits, be bit or quasi-bit organized. Present-day techniques for controlling the geometric and material properties of a large, vacuum deposited, thin-film cryoelectric array are not sufficient to produce a 2-wire bit-organized memory with an acceptable operating margin. To circumvent this problem new systems, whose electrical operation is relatively independent of these variations, are needed. One such random access memory, the 3-wire cryoelectric memory system, is an example of this philosophy. The storage and selection functions are separated, the former being handled by an S line, while the latter is handled by an X and Y line. For particular memory cell design, the system can be operated in a mode in which the selection current is independent of stored current. This eliminates one of the parameters responsible for variations in the threshold and disturb currents. An added feature of such a system is the uniformity in the stored current levels (in a properly designed cell), since the S line can be serially connected throughout all bits common to a particular digit. Although such a cell requires more structure than previously proposed cells, the operational advantages are judged to be the over-riding consideration.
Keywords :
Magnetic film memories; Superconducting memories; Helium; Material properties; Optical arrays; Random access memory; Read-write memory; Sputtering; Superconducting materials; System testing; Vacuum technology; Writing;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1966.1065812
Filename :
1065812
Link To Document :
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