• DocumentCode
    1033021
  • Title

    Comment on published carrier lifetime data on silicon-on-insulator (SOI) materials

  • Author

    Das, Krishanu

  • Author_Institution
    North Carolina State University, Department of Electrical & Computer Engineering, Raleigh, USA
  • Volume
    23
  • Issue
    11
  • fYear
    1987
  • Firstpage
    579
  • Keywords
    carrier lifetime; MOS capacitors; SOI; SOI structures; back interface; comment and reply; comparison of carrier lifetime data; diodes; generation lifetimes; published carrier lifetime data; recombination lifetimes;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19870414
  • Filename
    4257746