DocumentCode
1033021
Title
Comment on published carrier lifetime data on silicon-on-insulator (SOI) materials
Author
Das, Krishanu
Author_Institution
North Carolina State University, Department of Electrical & Computer Engineering, Raleigh, USA
Volume
23
Issue
11
fYear
1987
Firstpage
579
Keywords
carrier lifetime; MOS capacitors; SOI; SOI structures; back interface; comment and reply; comparison of carrier lifetime data; diodes; generation lifetimes; published carrier lifetime data; recombination lifetimes;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19870414
Filename
4257746
Link To Document