Title :
Field-effect conductance modulation in extremely thin films of cesium
Author :
Kamins, Theodore I. ; Muller, R.S.
fDate :
9/1/1968 12:00:00 AM
Keywords :
Charge carrier processes; Electron emission; Electron traps; Insulation; Interface states; Laboratories; Semiconductor thin films; Telephony; Transistors; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16429
