DocumentCode
1033083
Title
Fowler-Nordheim tunneling into thermally grown SiO2
Author
Lenzlinger, M. ; Snow, E.H.
Volume
15
Issue
9
fYear
1968
fDate
9/1/1968 12:00:00 AM
Firstpage
686
Lastpage
686
Keywords
Charge carrier processes; Conductivity; Electron emission; Electron traps; Ferroelectric materials; Insulation; Interface states; Laboratories; Tunneling; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1968.16430
Filename
1475332
Link To Document