DocumentCode
1033084
Title
Metallized and oxidized silicon macropore arrays filled with a scintillator for CCD-based X-ray imaging detectors
Author
Badel, X. ; Linnros, J. ; Kleimann, P. ; Norlin, B. ; Koskiahde, E. ; Valpas, K. ; Nenonen, S. ; Petersson, C.S. ; Fröjdh, C.
Author_Institution
Dept. of Microelectron. & Inf. Technol., R. Inst. of Technol. of Sweden, Kista, Sweden
Volume
51
Issue
3
fYear
2004
fDate
6/1/2004 12:00:00 AM
Firstpage
1001
Lastpage
1005
Abstract
Silicon charge-coupled devices (CCDs) covered with a scintillating film are now available on the market for use in digital medical imaging. However, these devices could still be improved in terms of sensitivity and especially spatial resolution by coating the CCD with an array of scintillating waveguides. In this paper, such waveguides were fabricated by first etching pores in silicon, then performing metallization or oxidation of the pore walls and finally filling the pores with CsI(Tl). The resulting structures were observed using scanning electron microscopy and tested under X-ray exposure. Theoretical efficiencies of macropore arrays filled with CsI(Tl) were also calculated, indicating that the optimal pore depth for metallized macropore arrays is about 80 μm while it is around 350 μm for oxidized ones. This result, together with the roughness of the metal coating, explains why lower SNR values were measured with the metallized macropores. Indeed, the macropore arrays had depths in the range of 210-390 μm, which is favorable to oxidized structures.
Keywords
CCD image sensors; X-ray detection; X-ray imaging; biomedical imaging; caesium compounds; etching; metallisation; oxidation; porosity; scanning electron microscopy; silicon; solid scintillation detectors; surface structure; waveguides; 210 to 390 micron; CCD-based X-ray imaging detectors; CsI(Tl); SNR values; Si; X-ray exposure; digital medical imaging; etching; metal coating roughness; metallization; metallized silicon macropore arrays; optimal pore depth; oxidized silicon macropore arrays; oxidized structures; pixellated detectors; scanning electron microscopy; scintillating film; scintillating waveguides; scintillator; sensitivity; signal-to-noise ratio; silicon charge-coupled devices; spatial resolution; Biomedical imaging; Coatings; Metallization; Semiconductor films; Sensor arrays; Silicon; Spatial resolution; X-ray detection; X-ray detectors; X-ray imaging; CsI; Tl; X-ray imaging; pixellated detectors; scintillating waveguides;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2004.829579
Filename
1312006
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