DocumentCode
1033188
Title
Pulse discrimination between recoil protons and secondary electrons for a silicon diode based neutron spectrometer
Author
Fazzi, Alberto ; Agosteo, Stefano ; Pola, Andrea ; Varoli, Vincenzo ; Zotto, Pierluigi
Author_Institution
Nucl. Eng. Dept., Politecnico di Milano, Italy
Volume
51
Issue
3
fYear
2004
fDate
6/1/2004 12:00:00 AM
Firstpage
1049
Lastpage
1055
Abstract
The feasibility of the discrimination between protons and secondary electrons was investigated in order to decrease the lower limit of a recoil-proton spectrometer for neutrons based on a silicon p-i-n diode. The simulation of the ionization generated in the detector by protons and electrons and the simulation of the relevant induced currents show that such discrimination is feasible provided that the "rear side injection" configuration and a low noise setup are adopted. The difference between the collecting times of the two pulses is maximized and used for the rising time based discrimination. The neutron spectrometer consists of a 3 mm2 area, 300 μm-thick silicon p-i-n diode covered with a polyethylene foil on the n-side. The ENC is 720 rms electrons at 20 ns shaping time. Experimental results on monoenergetic neutrons show the effectiveness of this discrimination in decreasing the lower limit of the recoil proton energy spectrum from 1.1 to 0.6 MeV.
Keywords
foils; neutron detection; neutron spectrometers; nuclear electronics; p-i-n diodes; polymers; pulse shaping circuits; silicon radiation detectors; 1.1 MeV to 0.6 MeV; 20 ns; 300 micron; ENC; induced current simulation; ionization simulation; low noise setup; monoenergetic neutrons; n-side; polyethylene foil; pulse discrimination; rear side injection configuration; recoil proton energy spectrum; recoil-proton spectrometer; secondary electrons; shaping time; silicon diode based neutron spectrometer; silicon p-i-n diode; Detectors; Electrons; Ionization; Neutrons; Noise generators; P-i-n diodes; Polyethylene; Protons; Silicon; Spectroscopy; Neutron spectrometry; pulse discrimination;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2004.829396
Filename
1312015
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