Title :
Doping distribution effects on n-n+GaAs epitaxial layer infrared reflectivity spectra
fDate :
9/1/1968 12:00:00 AM
Keywords :
Diodes; Doping; Electric resistance; Electrical resistance measurement; Fluid flow measurement; Frequency dependence; Heat sinks; Resistance heating; Temperature sensors; Thermal resistance;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16449
