Title :
A new method for measuring the heat flow resistance in flip-chip mounted avalanche diodes
fDate :
9/1/1968 12:00:00 AM
Keywords :
Doping; Electrical resistance measurement; Electron traps; Fluid flow measurement; Heat treatment; P-i-n diodes; Plasma temperature; Resistance heating; Silicon; Zinc compounds;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16450
