DocumentCode
1033290
Title
Characterization of Refractive Index Distribution in Spherical Microlenses Fabricated by Deep Proton Writing
Author
Kniazewski, P. ; Gomez, V. ; Pakula, A. ; Ottevaere, H. ; Kujawinska, M. ; Thienpont, H.
Author_Institution
Warsaw Univ. of Technol. IMiF, Warsaw
Volume
20
Issue
3
fYear
2008
Firstpage
208
Lastpage
210
Abstract
In this letter, we present the results of the refractive index measurements on deep proton writing microlenses. The measurement method used is interferometric tomography. It is a nondestructive method for the determination of the 3-D internal refractive index distributions. The influence of the different fabrication steps on the refractive index distribution is discussed.
Keywords
light interferometry; microlenses; nondestructive testing; optical fabrication; optical tomography; refractive index measurement; 3D internal refractive index distributions; deep proton writing; interferometric tomography; nondestructive method; refractive index measurements; spherical microlenses; Lenses; Microoptics; Optical device fabrication; Optical interferometry; Polymers; Protons; Refractive index; Temperature; Tomography; Writing; Deep proton writing (DPW) technology; interferometric tomography; microlens; refractive index distribution;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2007.913233
Filename
4429335
Link To Document