• DocumentCode
    1033343
  • Title

    Index profiling of distributed-index lenses by a total reflection method

  • Author

    Zhu, X. ; Iga, K.

  • Author_Institution
    Tokyo Institute of Technology, Research Laboratory of Precision Machinery & Electronics, Yokohama, Japan
  • Volume
    23
  • Issue
    12
  • fYear
    1987
  • Firstpage
    626
  • Lastpage
    627
  • Abstract
    A simple index profiling method using total reflection is proposed. By a preliminary experiment, its accuracy was confirmed to be about 0.1% and its spatial resolution about 2¿m. The index profile of a planar microlens was measured and compared with theoretical calculations.
  • Keywords
    gradient index optics; lenses; light reflection; optical testing; refractive index measurement; 2 micron; distributed-index lenses; graded index components; index profiling method; optical testing; planar microlens; refractive index; spatial resolution; total reflection method;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19870448
  • Filename
    4257781
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1033343