DocumentCode
1033512
Title
A Triggered Chopping Gap for Use in Transformer Testing
Author
Parnell, T.M.
Author_Institution
Department of Electrical Engineering, University of Queensland
Issue
11
fYear
1968
Firstpage
1885
Lastpage
1888
Abstract
Fault detection during chopped-wave impulse tests on transformers requires that the time to chop be constant at various levels of applied voltage. Apparatus devised for this purpose is described. Time to chop in the 1-to 6-¿s range can be selected and reproduced with a precision better than 0.1 ¿s at voltage levels up to 400 kV. This system has been successfully used for over five years in the impulse testing of transformers rated at 66 kV and under.
Keywords
Circuit faults; Circuit testing; Electric breakdown; Electrodes; Fault detection; Impulse testing; Insulation testing; Power transformer insulation; Pulse generation; Voltage;
fLanguage
English
Journal_Title
Power Apparatus and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0018-9510
Type
jour
DOI
10.1109/TPAS.1968.292009
Filename
4073469
Link To Document