Title :
High resolution multiplication and current fluctuation measurements on uniform avalanche diodes
Author :
Lee, Craig A. ; Dalman, G.C.
fDate :
9/1/1968 12:00:00 AM
Keywords :
Bandwidth; Current measurement; Diodes; Fluctuations; Frequency conversion; Frequency modulation; Iris; Laboratories; Oscillators; Resonance;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16481
