DocumentCode
1033784
Title
Double diffused high-speed germanium transistors
Author
Gansauge, Peter
Author_Institution
IBM Laboratory, Boeblingen/Wuertt, Germany
Volume
15
Issue
10
fYear
1968
fDate
10/1/1968 12:00:00 AM
Firstpage
728
Lastpage
731
Abstract
It has been predicted that Ge transistors should exhibit faster switching speed than Si devices of comparable geometry, due to the higher electron and hole mobility in germanium. The development of techniques for the deposition of masking films and diffusion of donors and acceptors in Ge enables processing of double diffused planar transistors in a manner similar to those used in silicon. This paper describes and discusses these processes for both
and
transistors. The dc and high-frequency performance of these transistors reach expected values and indicate a superiority of germanium in high-speed performance.
and
transistors. The dc and high-frequency performance of these transistors reach expected values and indicate a superiority of germanium in high-speed performance.Keywords
Charge carrier processes; Electric breakdown; Electron devices; Electron mobility; FETs; Geometry; Germanium; Silicon; Snow; Solid state circuits;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1968.16505
Filename
1475407
Link To Document