• DocumentCode
    1033784
  • Title

    Double diffused high-speed germanium transistors

  • Author

    Gansauge, Peter

  • Author_Institution
    IBM Laboratory, Boeblingen/Wuertt, Germany
  • Volume
    15
  • Issue
    10
  • fYear
    1968
  • fDate
    10/1/1968 12:00:00 AM
  • Firstpage
    728
  • Lastpage
    731
  • Abstract
    It has been predicted that Ge transistors should exhibit faster switching speed than Si devices of comparable geometry, due to the higher electron and hole mobility in germanium. The development of techniques for the deposition of masking films and diffusion of donors and acceptors in Ge enables processing of double diffused planar transistors in a manner similar to those used in silicon. This paper describes and discusses these processes for both n-p-n and p-n-p transistors. The dc and high-frequency performance of these transistors reach expected values and indicate a superiority of germanium in high-speed performance.
  • Keywords
    Charge carrier processes; Electric breakdown; Electron devices; Electron mobility; FETs; Geometry; Germanium; Silicon; Snow; Solid state circuits;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1968.16505
  • Filename
    1475407