DocumentCode :
1033886
Title :
Magnetic flux reversal in laminated Ni-Fe films
Author :
Humphrey, F.B. ; Hasegawa, R. ; Clow, H.
Author_Institution :
California Institute of Technology, Pasadena, Calif.
Volume :
2
Issue :
3
fYear :
1966
fDate :
9/1/1966 12:00:00 AM
Firstpage :
557
Lastpage :
559
Abstract :
Anomalously fast flux reversal has been observed in films made of Ni-Fe layers separated by SiO. The speed of reversal increases as the number of identical layers of Ni-Fe increases. For a 5-layer film, the anomalous speed is observed in films with the SiO thickness as great as 1600 Å. Reversal time curves presented as a family of curves of 1/\\tau = f(h_{\\perp }) with hsas a parameter have two regions. The high-drive region has a lower slope in the laminated films when compared to the single-layer films. For this family of curves, a switching coefficient S_{w\´} can be defined, as the inverse slope, in a manner similar to the definition of Swfor 1/\\tau = f(h_{s}) with h_{\\perp } as a parameter. For films with from two to five layers, Sw\´ is constant at 1 \\times 10^{-3} \\mu s and is smaller by an order of magnitude for the single-layer films. A dual loop experiment is used to confirm that coherent rotation is not a dominant mechanism. It is concluded that a model must satisfy the following criteria to successfully describe flux reversal in the laminated films: It must provide rapid flux reversal for fields less than Hk, an insensitivity to transverse fields either constant or pulsed, and an interaction that can survive over a wide range of SiO thicknesses.
Keywords :
Iron-nickel films; Laminated magnetic materials; Magnetization reversal; Nickel-iron films; Anisotropic magnetoresistance; Coercive force; Glass; Laboratories; Magnetic films; Magnetic flux; Magnetic separation; Substrates; Thickness control; Thickness measurement;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1966.1065923
Filename :
1065923
Link To Document :
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