Title :
Silicon transistor ICEOcharacteristics on a curve tracer
fDate :
10/1/1968 12:00:00 AM
Abstract :
It is shown that the loop frequently observed in curve-tracer measurements of ICEOis generated by capacitive currents in the junction capacitances, together with the forward and reverse conduction properties of the emitter-base diode, and is not representative of true ICEO. A true ICEOmeasurement may take several hours.
Keywords :
Capacitance; Capacitors; Conductivity; Current measurement; Diodes; Electric resistance; Leakage current; Radio frequency; Silicon; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16518
