• DocumentCode
    1033912
  • Title

    Silicon transistor ICEOcharacteristics on a curve tracer

  • Author

    Bradshaw, P.D.

  • Volume
    15
  • Issue
    10
  • fYear
    1968
  • fDate
    10/1/1968 12:00:00 AM
  • Firstpage
    793
  • Lastpage
    794
  • Abstract
    It is shown that the loop frequently observed in curve-tracer measurements of ICEOis generated by capacitive currents in the junction capacitances, together with the forward and reverse conduction properties of the emitter-base diode, and is not representative of true ICEO. A true ICEOmeasurement may take several hours.
  • Keywords
    Capacitance; Capacitors; Conductivity; Current measurement; Diodes; Electric resistance; Leakage current; Radio frequency; Silicon; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1968.16518
  • Filename
    1475420
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1033912