• DocumentCode
    1034090
  • Title

    Measurement of noise along electrostatically focused electron beams

  • Author

    Gopinath, Anand ; Ono, Shintaro ; Hartnagel, H.L.

  • Volume
    15
  • Issue
    11
  • fYear
    1968
  • fDate
    11/1/1968 12:00:00 AM
  • Firstpage
    936
  • Lastpage
    938
  • Abstract
    Noise along periodic-electrostatically focused electron beams have been measured. The noise variation is periodic with the wavelength of the reduced plasma frequency. It is concluded that electrostatic focusing exhibits similar noise properties as magnetic focusing.
  • Keywords
    Electron beams; Electrostatic measurements; Frequency; Magnetic noise; Noise measurement; Noise reduction; Plasma measurements; Plasma properties; Plasma waves; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1968.16537
  • Filename
    1475439