DocumentCode :
1034090
Title :
Measurement of noise along electrostatically focused electron beams
Author :
Gopinath, Anand ; Ono, Shintaro ; Hartnagel, H.L.
Volume :
15
Issue :
11
fYear :
1968
fDate :
11/1/1968 12:00:00 AM
Firstpage :
936
Lastpage :
938
Abstract :
Noise along periodic-electrostatically focused electron beams have been measured. The noise variation is periodic with the wavelength of the reduced plasma frequency. It is concluded that electrostatic focusing exhibits similar noise properties as magnetic focusing.
Keywords :
Electron beams; Electrostatic measurements; Frequency; Magnetic noise; Noise measurement; Noise reduction; Plasma measurements; Plasma properties; Plasma waves; Wavelength measurement;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1968.16537
Filename :
1475439
Link To Document :
بازگشت