DocumentCode :
1034353
Title :
Über die dicke von 180°-Blochwanden auf der oberfläche von kompakten siliziumeisen
Author :
Kranz, J. ; Buchenau, U. ; Kranz, Johann ; Buchenau, U.
Author_Institution :
I. Physikalischen Institut der Universität, Munich, Germany
Volume :
2
Issue :
3
fYear :
1966
fDate :
9/1/1966 12:00:00 AM
Firstpage :
297
Lastpage :
301
Abstract :
The 180°-Bloch wall on the surface of bulk silicon iron was studied by means of the magneto-optical Kerr effect. As the Bloch wall thickness amounts to about 1000-2000 Å, the structure of the wall cannot be dissolved by an optical microscope. Only a diffraction pattern may be obtained as image of the wall. Though the form of the diffraction pattern shows no relation to the wall structure, the brightness will increase with wall width. By this effect it should be possible to determine the wall thickness. In our experiment, a 180°-Bloch wall was studied on the
Keywords :
Antiferromagnetic materials; Iron; Magnetic flux; Magnetic resonance; Magnetostatics; Nonlinear optics; Optical harmonic generation; Optical microscopy; Optical saturation; Silicon;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1966.1065965
Filename :
1065965
Link To Document :
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