DocumentCode
1034441
Title
Characteristics of two-region saturation phenomena
Author
Clark, Lowell E.
Author_Institution
Motorola Semiconductor Products Division, Phoenix, Ariz.
Volume
16
Issue
1
fYear
1969
fDate
1/1/1969 12:00:00 AM
Firstpage
113
Lastpage
116
Abstract
Diffused base bipolar transistors, especially high-voltage types, often exhibit two pronounced saturation regions. This paper elucidates the qualitative and quantitative features of this behavior which is due to conductivity modulation of the lightly doped collector region. The transport equations for ambipolar conduction in the collector region are solved with a minimum of simplifying assumptions. It is shown how this portion of the solution explains the general features of the phenomenon. A complete solution for the collector
characteristics depends on an explicit knowledge of the recombination statistics in both the base and collector regions. A simple case is considered to demonstrate the detailed dependence of the phenomena on the physical structure. Design tradeoffs involved in the control of the
characteristics are discussed in the light of the results obtained from the analysis.
characteristics depends on an explicit knowledge of the recombination statistics in both the base and collector regions. A simple case is considered to demonstrate the detailed dependence of the phenomena on the physical structure. Design tradeoffs involved in the control of the
characteristics are discussed in the light of the results obtained from the analysis.Keywords
Doping; Electric resistance; Electron devices; Insulation; P-n junctions; Physics; Silicon; Solid state circuits; Surface resistance; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1969.16572
Filename
1475615
Link To Document