DocumentCode
1034509
Title
Method of skew measurement of thin megnetic films
Author
Pitke, M.V.
Author_Institution
Tata Institute of fundamental Research, Bombay, India
Volume
2
Issue
4
fYear
1966
fDate
12/1/1966 12:00:00 AM
Firstpage
774
Lastpage
776
Keywords
Magnetic films; Magnetic measurements; Anisotropic magnetoresistance; Magnetic analysis; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Magnetization; Perpendicular magnetic anisotropy; Testing; Transistors; Voltage;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1966.1065979
Filename
1065979
Link To Document