Title :
Method of skew measurement of thin megnetic films
Author_Institution :
Tata Institute of fundamental Research, Bombay, India
fDate :
12/1/1966 12:00:00 AM
Keywords :
Magnetic films; Magnetic measurements; Anisotropic magnetoresistance; Magnetic analysis; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Magnetization; Perpendicular magnetic anisotropy; Testing; Transistors; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1966.1065979
