• DocumentCode
    1034568
  • Title

    The Measurement of Dielectric Loss at High Frequencies an Under Changing Temperature

  • Author

    Whitehead, J.B. ; Rueggeberg, W.

  • Author_Institution
    Professor of electrical engineering, School of Engineering, The Johns Hopkins University, Baltimore, Md.
  • Volume
    68
  • Issue
    1
  • fYear
    1949
  • fDate
    7/1/1949 12:00:00 AM
  • Firstpage
    520
  • Lastpage
    524
  • Abstract
    1. A method of measuring the properties of a dielectric while its temperature is changing has been developed and applied to certain thermosetting materials under high-frequency heating. 2. The presence of absorbed moisture in small amounts has a pronounced influence on the dielectric properties of such materials. A method for dealing with samples containg moisture is described. 3. Two basic phenomena are active in dielectric heating at high frequencies: dielectric absorbtion (in the Maxwell sense); and some form of molecular polarization. The former is evident in high-stress short-time heating cycles. The latter is the more important for the thermosetting process, and is completely developed in longer lower-stress heating cyc es. 4. The method provides a simple means of determining the total energy input per cycle and per cubic centimeter of the material under study.
  • Keywords
    Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Frequency measurement; Heating; Loss measurement; Moisture; Polarization; Temperature;
  • fLanguage
    English
  • Journal_Title
    American Institute of Electrical Engineers, Transactions of the
  • Publisher
    ieee
  • ISSN
    0096-3860
  • Type

    jour

  • DOI
    10.1109/T-AIEE.1949.5059970
  • Filename
    5059970