DocumentCode
1034568
Title
The Measurement of Dielectric Loss at High Frequencies an Under Changing Temperature
Author
Whitehead, J.B. ; Rueggeberg, W.
Author_Institution
Professor of electrical engineering, School of Engineering, The Johns Hopkins University, Baltimore, Md.
Volume
68
Issue
1
fYear
1949
fDate
7/1/1949 12:00:00 AM
Firstpage
520
Lastpage
524
Abstract
1. A method of measuring the properties of a dielectric while its temperature is changing has been developed and applied to certain thermosetting materials under high-frequency heating. 2. The presence of absorbed moisture in small amounts has a pronounced influence on the dielectric properties of such materials. A method for dealing with samples containg moisture is described. 3. Two basic phenomena are active in dielectric heating at high frequencies: dielectric absorbtion (in the Maxwell sense); and some form of molecular polarization. The former is evident in high-stress short-time heating cycles. The latter is the more important for the thermosetting process, and is completely developed in longer lower-stress heating cyc es. 4. The method provides a simple means of determining the total energy input per cycle and per cubic centimeter of the material under study.
Keywords
Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Frequency measurement; Heating; Loss measurement; Moisture; Polarization; Temperature;
fLanguage
English
Journal_Title
American Institute of Electrical Engineers, Transactions of the
Publisher
ieee
ISSN
0096-3860
Type
jour
DOI
10.1109/T-AIEE.1949.5059970
Filename
5059970
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