• DocumentCode
    1034600
  • Title

    A numerical estimate of transport properties in degenerate silicon p-n junctions

  • Author

    Brient, S. John, Jr. ; Wilson, Charles L.

  • Author_Institution
    The University of Texas, El Paso, Tex.
  • Volume
    16
  • Issue
    2
  • fYear
    1969
  • fDate
    2/1/1969 12:00:00 AM
  • Firstpage
    177
  • Lastpage
    185
  • Abstract
    Magnitudes of the transport terms describing hole and electron motion in extrinsic degenerate silicon with large impurity gradients are calculated using Fermi-Dirac statistics. The absolute error between these transport terms using Boltzmann statistics and Fermi-Dirac statistics is tabulated for the reduced Fermi energy level from - 15 kT units to + 15 kT units. An accurate equilibrium state is assumed, and the effects of impurity scattering and electric field on the mobility are examined. The necessity for including impurity scattering in steady and transient states has been demonstrated. It was found necessary to maintain better than a 1:106accuracy in the Fermi-Dirac integrals in order to obtain a highly accurate equilibrium state.
  • Keywords
    Charge carrier processes; Energy states; Impurities; Laboratories; P-n junctions; Scattering; Silicon; Spontaneous emission; State estimation; Statistics;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1969.16587
  • Filename
    1475629