DocumentCode
1034600
Title
A numerical estimate of transport properties in degenerate silicon p-n junctions
Author
Brient, S. John, Jr. ; Wilson, Charles L.
Author_Institution
The University of Texas, El Paso, Tex.
Volume
16
Issue
2
fYear
1969
fDate
2/1/1969 12:00:00 AM
Firstpage
177
Lastpage
185
Abstract
Magnitudes of the transport terms describing hole and electron motion in extrinsic degenerate silicon with large impurity gradients are calculated using Fermi-Dirac statistics. The absolute error between these transport terms using Boltzmann statistics and Fermi-Dirac statistics is tabulated for the reduced Fermi energy level from - 15 kT units to + 15 kT units. An accurate equilibrium state is assumed, and the effects of impurity scattering and electric field on the mobility are examined. The necessity for including impurity scattering in steady and transient states has been demonstrated. It was found necessary to maintain better than a 1:106accuracy in the Fermi-Dirac integrals in order to obtain a highly accurate equilibrium state.
Keywords
Charge carrier processes; Energy states; Impurities; Laboratories; P-n junctions; Scattering; Silicon; Spontaneous emission; State estimation; Statistics;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1969.16587
Filename
1475629
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