Title :
Sequential Aspects of Relay Circuits
Author_Institution :
Bell Telephone Laboratories, Inc., New York, N. Y.
fDate :
7/1/1949 12:00:00 AM
Keywords :
Automatic control; Central office; Circuit testing; Control systems; Electrical capacitance tomography; Registers; Relays; Switching circuits; Switching systems; Telephony;
Journal_Title :
American Institute of Electrical Engineers, Transactions of the
DOI :
10.1109/T-AIEE.1949.5059978
