Title :
Effect of collector design on hot-spot formation and second breakdown in transistors
Author :
Reich, B. ; Hakim, E.B.
fDate :
2/1/1969 12:00:00 AM
Keywords :
Breakdown voltage; Chromium; Conductivity; Electric breakdown; Electric resistance; Electrical resistance measurement; Infrared detectors; Temperature measurement; Thermal factors; Thermal resistance;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1969.16596
